The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Author: Kai-hui Chang
Publisher: Springer Science & Business Media
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
After localizing the faulty macro f we start the design error diagnosis at the gate
level according to Theorem 6.2 . Different strategies ... Combining Functional and
Structural Approaches in Test Generation for Digital Systems . Micro - electronics
Author: Marcelo Lubaszewski
Publisher: IEEE Computer Society
Topics in this book on integrated circuit design include: hardware-software codesign of embedded systems; the ALFA-HUERTA project; rapid prototyping; digital testing; and digital design."
Actual in - circuit worst - case device parameters and interconnection delays must
be determined and used to ... To utilize the potential operating speed of today ' s
digital devices , the functional design and the interconnection and power ...
Nonetheless , most of the effort in most digital designs remains focused on the
functional logic design even though logic errors or functional concept errors are ...
Author: James Edgar Buchanan
Publisher: McGraw-Hill Companies
"This book shows designers how to ensure signal integrity and control noise in high-speed digital systems - particularly important in a Pentium-paced environment where functional logic design is no longer separable from electrical and mechanical design." "Highlighting TTL, CMOS, and BiCMOS logic applications in a single source, Signal and Power Integrity in Digital Systems provides a practical solutions-oriented approach to a wide variety of relevant interconnection and timing issues." "Special features include noise tolerant logic architectures; power distribution techniques that reduce noise; clock distribution techniques that ensure clock signal quality; signal interconnection techniques that reduce crosstalk, signal loading, and transmission-line effects; how to get optimum performance from high-speed memory devices; and system application tips for high-speed PALs, PLAs, FIFOs, and ASICs." "Designers will also appreciate the practical engineering approximations provided for the calculation of design parameters along with illustrations and numerous tables usable for quick reference and comparison of characteristics." "It's a book every digital designer should have - engineers involved in the design of computers, peripherals, signal processors, and control and communications equipment, as well as young engineers facing their first designs using high-speed logic devices."--BOOK JACKET.Title Summary field provided by Blackwell North America, Inc. All Rights Reserved